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Semiconductor Microscopes and Supplies
A good semiconductor microscope can improve speed and accuracy of your inspection and quality control, as well as failure analysis, and rework.
We don't have to tell you that costs are rising in your industry, and it takes more and more time to inspect each wafer. The size of a semiconductor wafer is shrinking, and it's harder and harder to find defects in any modern semiconductor device.
That means quality control is done in multiple steps using multiple instruments
One step is completed with a brightfield optical microscope.
With an optical microscope, the resolution is not always high enough to see device structures clearly at high magnification.
Plus, the observation angle of the semiconductor is fixed, which makes it difficult to observe the edges of a wafer and perform edge analysis with a standard optical microscope.
Measurement of structures on the surface can also be unreasonably time-consuming under standard optics, and often the specimen is measured under a different instrument, adding steps to the QC process.
Another step might be completed using a scanning electron microscope.
For scanning electron microscopy to work, the sample will undergo sample preparation in a vacuum chamber, and imaging is obtained in monochrome - not ideal for any QC workflow.
QC steps can be reduced across the semiconductor industry by performing quality control on semiconductor materials, integrated circuits, with extremely high resolution imaging from an optical semiconductor microscope.
What does that mean?
It means the semiconductor inspection microscopes below are broadly the best tools for your job.
You'll find Dino-Lite edge inspection microscopes suitable for high-throughput inspection applications.
You'll find Mitutoyo semiconductor inspection microscopes, suitable for fitting to specialist machines designed for observation and inspection and repair of semiconductor wafers using YAG (near-infrared, visible, near-ultraviolet, or ultraviolet) lasers.
Common applications include internal observation of silicon systems or spectral characteristics analysis using infrared.
*They can not provide you insights into QC on nanostructures - that level of detail requires an atomic force microscope (and a much larger investment).
These microscopes are the best mix of value and features for semiconductor manufacturing businesses where quality control is important (sounds like you, right?).
The Mitutoyo units inward-facing turret and long working distance objective lens maintain the high operability of the microscope in all semiconductor inspection applications.
The Dino0Lites are ideal for easily capturing and annotating QC images for posterity.
Models supporting brightfield, darkfield, polarization, and differential interference contrast (Mitutoyo) are available for any semiconductor manufacturer in need of different illumination types for their unique QC technique.
Quality control for semiconductor applications requires multiple steps. The semiconductor microscopes below serve as the workhorse of your QC process and supplement other techniques (like atomic force microscopy) to provide robust semiconductor quality control.
We'd love to know more about your application. Call us to talk about your next microscope order.
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